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Particle stamp SEM

Particle stamp SEM

Product number: 30035

Non-spring mounted white Ø 41 mm (without microscopic evaluation)

Unit:

  • Particle stamp for the analysis using the scanning electron microscope (SEM)
  • Suitable for the analysis of particles with particle size > 25 μm due to the material basic structures
  • Analysis of purely metallic particles possible from a particle size > 5 μm
  • Particles on a surface can be directly collected and analyzed

Technical data

  • White adhesive pad (vacuum stable for several hours at low vacuum of 35 PA)
  • Pull-tab for easy removal of the protective film
  • Material basic structure of carbon and oxygen and silicon-containing (own) particles < 25 μm
  • Guide pad for fixation in the SEM-sampling table, which is attached on the underside of the SEM stamp
  • Dimensions of the box (Ø 45.5 mm) optimally matched into the recess of the SEM-sampling table.

CleanControlling – A focus on particles