This online shop is using cookies to give you the best shopping experience. Thereby for example the session information or language setting are stored on your computer. Without cookies the range of the online shop's functionality is limited. If you don't agree, please click here.

Particle stamp SEM

Product number: 30035

Non-spring mounted white Ø 41 mm (without microscopic evaluation)

  • Particle stamp for the analysis using the scanning electron microscope (SEM)
  • Suitable for the analysis of particles with particle size > 25 μm due to the material basic structures
  • Analysis of purely metallic particles possible from a particle size > 5 μm
  • Particles on a surface can be directly collected and analyzed

Technical data

  • White adhesive pad (vacuum stable for several hours at low vacuum of 35 PA)
  • Pull-tab for easy removal of the protective film
  • Material basic structure of carbon and oxygen and silicon-containing (own) particles < 25 μm
  • Guide pad for fixation in the SEM-sampling table, which is attached on the underside of the SEM stamp
  • Dimensions of the box (Ø 45.5 mm) optimally matched into the recess of the SEM-sampling table.