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Product number: 30001_10 / 30001_100
white Ø 47 mm (without microscopic evaluation)
from 43,00 €
Product number: 30023
Black Ø 41 mm (without microscopic evaluation)
from 65,00 €
Product number: 30043
white Ø 41 mm (without microscopic evaluation)
from 82,00 €
Product number: 30005
for particle trap
9,90 € *
Product number: 30012
Aluminum

Particle traps for the determination of airborne particle contamination. 

The testing and determination procedures for particulate contamination in ambient air described in VDA 19.2 "Technical cleanliness in assembly - environment, logistics, personnel and assembly equipment" can be carried out particularly easily, quickly and cost-effectively using particle traps. Particle traps represent a further development of the possibilities for monitoring airborne particles presented in VDA 19.2, which enable a correlation to the actual contamination of surfaces. 

Particle traps are used to determine airborne particle contamination and to monitor particle levels at predefined locations in assembly, feeding and process areas. For this purpose, particle traps are placed, for example, on workbenches and work surfaces, on walls, steel girders and other particle-relevant locations and collected again after a certain time. The particles sedimented and fixed on the particle trap can then be microscopically evaluated and analyzed. 

Particle traps also allow continuous monitoring of the particle accumulation at defined locations. In this way, cleanliness indicators such as the Illig value according to VDA 19.2 can be determined and the effectiveness of measures to increase technical cleanliness can be objectively determined. The Illig value is considered the benchmark for environmental cleanliness throughout the automotive industry. It allows a large number of different particles that can occur along the entire value stream to be evaluated with a single measure, thus quantifying the risk of contamination due to particle fallout. This solid basis can then be used to define targeted countermeasures and evaluate their effectiveness. 

Particle traps for different particles

In our online store we offer various particle traps for efficient particle monitoring. The "particle trap white 47 mm" allows the observation of particle occurrence at defined locations and thus the determination of cleanliness indicators such as the Illig value according to VDA 19.2. With the "particle trap black 41 mm", only bright and white particles and fibers can be displayed, which are clearly distinguishable due to the strong contrast. 

For the analysis of particularly small particles from a size of > 25 µm as well as purely metallic particles from a particle size of > 5 µm, we offer the "Particle trap SEM white 41 mm". The basic material structure of this particle trap consists of carbon and oxygen. The surface has an adhesive layer which remains vacuum-stable for several hours at a low vacuum of 35 PA and fixes particles in position. The particle trap is equipped with a conductive pad for fixation in the scanning electron microscope (SEM); the can fits exactly into the recess of the SEM sample-taking table. 

We offer an attractive discount when purchasing extensive quantities (100 pieces or more). Simply select the required quantity when placing your order. 

As a supplement to our particle traps, we carry coordinated accessories to place each particle trap quickly and exactly in the right place. Mounting brackets enable exact positioning wherever there is no horizontal support surface for the particle trap. The mounting brackets can be flexibly attached and later removed without leaving a trace. 

With the particle trap stand, which we also offer in a rental version, you can position particle traps easily and safely at any location. Each particle trap is placed on one of the four height-adjustable outriggers. The particle trap stand is made of a sturdy aluminum frame profile and is equipped with 4 ESD swivel casters with brakes. When not in use, the stand can be easily disassembled into three parts and stored to save space.