Particle stamp for the analysis of particle contamination of surfaces.
VDA 19.2 "Technical cleanliness in assembly - environment, logistics, personnel and assembly equipment" describes options for monitoring particles that allow correlation with actual contamination of surfaces. The particle stamp represents a further development of these options and allows snapshots of particle contamination of surfaces to be taken.
Unlike particle traps, particle stamps are used to determine and evaluate surface contamination on a limited area. The principle of operation is very simple: particles are picked up from the surface to be examined by pressing on and removing the adhesive stamp, and then adhere to the adhesive surface. The contact pressure is determined by the examining person; however, this can be compensated and leveled by the use of spring-loaded stamps. Immediately afterwards, the particle stamp is closed and can then be transported or sent in for microscopic analysis in accordance with cleanliness requirements.
In order to best meet the individual conditions prevailing in the company and the specific production requirements for technical cleanliness, we offer you a range of different particle punches that differ in their technical features and can therefore be used in a wide variety of ways. This gives you maximum flexibility, for example with regard to the contact pressure, the display of captured particles in the subsequent analysis, and the possible areas of application.
A stamp test can be used to create an actual image of any surface. On the upper side of the particle stamp there is a particle pad which fixes particles picked up from the stamped surface. In this way, particles on a surface can be recorded directly and then analyzed microscopically.
The right particle stamp for every application
Particle stamps are available in both spring-loaded and unspring-loaded versions. In the case of spring-loaded versions, a flexible spring element is embedded in the plunger, which ensures uniform contact pressure and thus uniform particle pickup that is independent of the analyzer. We offer spring-loaded particle punches with a diameter of 41 mm; for specimen collection in areas that cannot be reached with this standard size, we also carry punches with a diameter of only 13 mm.
We offer unsprung particle punches with a standard diameter of 41 mm as well as a more compact version with a diameter of 23 mm. We also have versions with black stamping areas in our range, which are suitable for the representation of light and white particles and fibers. Please note that automated standard evaluation is not possible here.
The white particle stamp SEM is suitable for analysis with the scanning electron microscope (SEM). Due to the basic material structures, particles from a size of > 25 µm can be analyzed with it; for purely metallic particles, analysis is even possible from a particle size of > 5 µm. The white adhesive pad is vacuum stable for several hours (at low vacuum of 35 PA) and can be fixed in the SEM specimen collection stage with a conductive pad attached to the underside. With a diameter of 45.5 mm, the SEM plunger fits perfectly into the recess of the specimen mounting stage.
Do you have special requirements that are not met by the offered particle stamps? We also develop and produce particle stamps individually according to customer specifications. Simply contact us without obligation and describe your request - we will surely find a solution!