Particle trap for SEM, white 41 mm

• Due to its material base structures suitable to analyse particles with particle size > 25 µm.
• SEM Particle trap to determine airborne particulate contaminants at your production facility.
• Material basic structure consisting of carbon and oxygen. Includes silicon-containing natural particles smaller than 25 microns.
• Regular quality assurance (blank value) for observation for the self-particle size necessary.
• Analysis of pure metallic particle from a particle size starting of 5 µm possible.
• Adhesive layer is vacuum stable over several hours at low vacuum of 35 PA, light, reversible surface curvatures possible, no sinking of objects or particles.
• Stamp surface changes slightly when very small objects are loaded selectively with a measurement period of 30 to 60 seconds.
• The box fits exactly into the recess of the SEM sample holder.
• Particles remain fixed in position. Object holder can be tilted or rotated for different perspectives of the particle.
• Particle scans with fiber requirements, fibers from the material base structures be counted and can influence the result.

Technical data:

• Box diameter 45.5 mm
• Homogeneous white adhesive pad
• Conductive pad for fixation in SEM
• Removable without leaving a trace (power strip)
• The can fits exactly into the recess of the SEM specimen mounting table. The can is connected to the labeling card by means of detachable adhesive dots and can be removed.